Zheng (Jen) Pan Photo
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Jen is an U.S.-trained litigator whose practice focuses on cross-border anti-corruption and fraud-related investigations and regulatory enforcement matters in the Asia Pacific region. Prior to joining Reed Smith, Jen practiced litigation in New York, where she also gained significant experience in corporate investigations. She also interned at the U.S. District Court, Southern District of New York.

Credentials

  • New York University School of Law, 2019, Juris Doctor
  • New York University, 2016, M.P.A.
  • Peking University, 2014, Bachelor of Economics

  • New York

  • English
  • Mandarin